Оборудование

Microscopes and interferometers

SOLVER Next. Scanning Probe Microscope

Investigation of the morphology of the surface of thin films using the basic techniques of atomic force microscopy. Topography, phase mapping, measurement of electrical characteristics, the possibility of nanolithography, etc.

Manufacturer/ NT-MDT, Russia

Microscopes and interferometers

Atomic Force Microscope NT-MDT NTEGRA Prima II

Investigation of the morphology of the surface of thin films using the basic techniques of atomic force microscopy. Topography, phase mapping, measurement of electrical characteristics, the possibility of nanolithography, etc.

Manufacturer/ NT-MDT, Russia

Microscopes and interferometers

MicroXAM-100 Optical profilometer

Designed for non-contact surface profiling by optical method with white light. The device combines phase-shifting interferometer technology and an optical microscope, which allows non-contact 3D measurements of surface roughness with subnanometer resolution

Manufacturer/ KLA-Tencor, USA

Microscopes and interferometers

Polarizing optical microscope Axioscop 40 A Pol

Designed for materials science, medical, geological and mineralogical laboratories, training and daily work. It is used for the study of ceramics, composite and building materials; for the study of materials: thin plates of rocks, films, fibers, biocrystals and pigments. Research methods: light and dark field, phase contrast, VARIO - contrast, polarized light

Manufacturer/ Carl Zeiss, Germany